JTAG test
The BUS JTAG
Once the test strategy has been clearly defined using the BUS JTAG, testing becomes much easier.
When the test strategy has been clearly defined with the use of the BUS JTAG, testing becomes easier, as long as the design office has followed the recommendations of the specialist who conducted the testability study (DFT Designe For Test).
When backed up by boundary-scan testing, conventional insitu testing can be retained to cover faults among mixed-signal elements and/or passive circuits.
What's more, this considerably reduces the complexity of test interfaces, and hence their cost.
The Boundary-scan
Using boundary-scan to test complex digital circuits
The use of boundary-scan for testing complex digital circuits often dispenses with the need for integrated circuit modeling and/or sophisticated interfaces such as contactless capacitive probes, but is often disappointing in use.
ATE est en mesure de vous proposer de développer des séquences de test JTAG avec la plupart des outils logiciels disponibles comme JTAG tech, Goeple, Temento ou nos propres développements internes directement utilisables avec le système de test in situ